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TEST PATTERN GENERATION DEVICE, TEST PROGRAM GENERATION DEVICE, GENERATION METHOD, PROGRAM, AND TEST DEVICE

机译:测试图案生成设备,测试程序生成设备,生成方法,程序和测试设备

摘要

PROBLEM TO BE SOLVED: To provide a device which enable even a user who is unfamiliar with hardware specifications of a test device and a program language for the test device to easily create a test pattern.;SOLUTION: There is provided a test pattern generation device which generates a test pattern for communicating with a subject device having a plurality of terminals, and includes: a primitive generation part which generates cycle primitive showing a signal pattern for communicating with each of the plurality of terminals in a reference cycle on the basis of an instruction of a user; a device cycle generation part which arranges a plurality of cycle primitives on the basis of the instruction of the user, and generates a device cycle showing signal patterns for a plurality of reference cycles; and a sequence generation part for arranging a plurality of device cycles on the basis of the instruction of the user to generate a sequence of the test pattern to be supplied to the subject device.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种装置,甚至使不熟悉测试装置的硬件规格和测试语言的程序语言的用户也能够轻松地创建测试图案。解决方案:提供了一种测试图案生成装置。产生用于与具有多个终端的本装置进行通信的测试模式的信号发生器,包括:图元生成部,其基于参考周期生成循环图元,该循环图元示出用于在基准周期内与多个终端中的每一个进行通信的信号模式。用户的指示;设备周期产生部分,其根据用户的指令安排多个周期原语,并产生显示多个参考周期的信号模式的设备周期;序列生成部分;以及序列生成部分,用于根据用户的指令安排多个设备周期,以生成要提供给目标设备的测试图案的序列。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013113665A

    专利类型

  • 公开/公告日2013-06-10

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;

    申请/专利号JP20110258916

  • 发明设计人 TOYODA TAKUYA;

    申请日2011-11-28

  • 分类号G01R31/3183;G01R31/28;G06F11/22;

  • 国家 JP

  • 入库时间 2022-08-21 16:57:15

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