TEST PATTERN GENERATION DEVICE, A TEST PROGRAM GENERATION DEVICE, A GENERATION METHOD, A PROGRAM, AND A TEST DEVICE EFFICIENTLY GENERATING A TEST PROGRAM

摘要

PURPOSE: A test pattern generation device, a test program generation device, a generation method, a program, and a test device are provided to enable a user to easily write a test pattern without considering a program language for the test device and hardware specification of the test device.;CONSTITUTION: A primitive generation unit(110) generates cycle primitive based on the indication of a user. A device cycle generation unit(130) arranges a plurality of cycle primitives based on the indication of the user and generates a device cycle which displays a signal pattern of a plurality of basic cycles. A sequence generation unit(150) arranges a plurality of device cycles based on the indication of the user and generates a sequence of a test pattern which is supplied to a tested device.;COPYRIGHT KIPO 2013;[Reference numerals] (10) Sequence; (100) Test pattern generation device; (110) Primitive generation unit; (120) Primitive memory unit; (130) Device cycle generation unit; (140) Device cycle memory unit; (150) Sequence generation unit