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Correction device of the X-ray spectrum measured correction method and X-ray spectrum measured
Correction device of the X-ray spectrum measured correction method and X-ray spectrum measured
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机译:X射线光谱测定校正方法及X射线光谱测定校正装置
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摘要
A method correcting a measured spectrum of X radiation, according to a number of channels Nc, each channel i corresponding to an energy range between Ei and Ei+&Dgr;Ei, including: determining function δti,j(k) determining size of temporal deviation &Dgr;t interval separating two interactions with energy Ei and Ej, stacking of which leads to a detected energy value Ek; determining, from the function δti,j(k), probability function Pi,j(k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Ei and Ej; determining, from the probability function Pi,j(k), a stack spectrum as a part of the measured spectrum that corresponds only to the stacks alone; and calculating or estimating at least a first corrected spectrum, by the difference between the measured spectrum and the stack spectrum.
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