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Impression radiation characteristic composition and new chemical compound

机译:印象辐射特性成分和新化合物

摘要

It is to offer the impression radiation characteristic composition and the like which purpose of this invention be superior can respond form a membrane in sensitivity, and resolution, the KrF excimer laser and the ArF excimer laser, (the pole) of EUV and the like the x-ray of the far ultraviolet ray and synchrotron radiation etc, nano- edge roughness, at the same time in high accuracy stabilizing minute pattern, the formation possible chemical expansion type positive type resist membrane effectively to the electronic beam. The impression radiation characteristic composition of this invention contains, are shown with the below-mentioned general formula (1) the acid occurrence medicine and the solvent which and. (In formula, R1 in independence, the hydrogen atom, shows the fluorine atom, or substitution or non substitution the organic basis mutually, at the same time inside R1 at least one shows the organic basis where portion or all of the fluorine atom or the hydrogen atom are substituted with the fluorine atom. R2 mutually in independence, the substitution which one possesses ester connection at least or shows the organic basis of 1 value of non substitution. n shows integer 0 - 3. M + shows oniumukachion of 1 value.)
机译:本发明的目的是为了提供一种能够在灵敏度,分辨率,膜,KrF准分子激光和ArF准分子激光,EUV(极)等方面响应于膜的印象放射特性组合物等。远紫外线X射线和同步辐射等,纳米边缘粗糙度,同时以高精度稳定微小图案,对电子束有效地形成可能的化学膨胀型正型抗蚀剂膜。本发明的印象放射线特性组合物包含下述通式(1)所示的酸产生剂和溶剂。 (式中,R 1 独立地为氢原子,表示氟原子,或相互取代或不取代有机基,同时在R 1 内为R 2 相互独立地表示至少具有酯连接性的取代基或表示至少1个具有氟原子或氢原子的一部分或全部被氟原子取代的有机碱。 1个非取代值的有机基。n表示整数0-3。M + 表示1个值的鎓。

著录项

  • 公开/公告号JPWO2012020627A1

    专利类型

  • 公开/公告日2013-10-28

    原文格式PDF

  • 申请/专利权人 JSR株式会社;

    申请/专利号JP20120528623

  • 发明设计人 丸山 研;

    申请日2011-07-20

  • 分类号C07C309/17;C07C381/12;C09K3/00;C08F20/10;C08F20/56;C08F12/04;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:40

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