首页> 外国专利> Detection method (referred to as tanδ) equipment within the insulator dielectric loss angle during operation

Detection method (referred to as tanδ) equipment within the insulator dielectric loss angle during operation

机译:运行过程中绝缘子介电损耗角内的检测方法(称为tanδ)设备

摘要

PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product.;SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种能够计算出tanδ的数学处理方法。尽管tanδ是退化程度的指标,迄今为止,无法测量相对于高绝缘体的介电损耗角(即介电损耗角),并且提供了一种检测tanδ的方法。解决方案:通过将高频域中的可变频率应用于测试对象,在每个频率上测量电路阻抗和相位,方法是在产品的操作线上移动对象。对应于麦克斯韦电磁方程的衰减常数和相位常数,使用最小二乘法或相对介电常数复数的矢量轨迹,以及tanδ的计算步骤。可以从与相位极值点相对应的介电常数提供。此外,使电流流过在生产线等上移动的测试对象与支撑仪器之间的杂散电容和tanδ。检测到移动物体的状态,并可以组织一个能够执行质量控制的系统。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP5082386B2

    专利类型

  • 公开/公告日2012-11-28

    原文格式PDF

  • 申请/专利权人 樋口 武光;

    申请/专利号JP20060298273

  • 发明设计人 樋口 武光;樋口 博文;

    申请日2006-10-03

  • 分类号G01R27/26;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:16

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