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Low-defect membrane film forming apparatus and low defect and low defect thin film deposition method

机译:低缺陷膜成膜装置及低缺陷和低缺陷薄膜沉积方法

摘要

PROBLEM TO BE SOLVED: To provide a low-defect thin film which is extremely little in deposition defects such as particles attached or embedded in a film under growth and a low-defect deposition method which is a method for manufacturing the same.;SOLUTION: In the deposition method performing thin-film formation by irradiating a target material with ions in a vacuum chamber to deposit the constitution material of the target material on a substrate, at least one or more seconds of non-irradiation time is set within one period of a first operation period of intermittent ion irradiation consisting of ion irradiation and ion non-irradiation.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种低缺陷的薄膜,该薄膜的生长缺陷极少,例如在生长过程中附着或嵌入薄膜中的颗粒,以及低缺陷的沉积方法,该薄膜的制造方法。在通过在真空室中用离子照射靶材料以将靶材料的构成材料沉积在基板上来执行薄膜形成的沉积方法中,将非照射时间设置为至少一个或多个秒。间歇性离子辐照的第一操作周期,包括离子辐照和离子非辐照。;版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP5135965B2

    专利类型

  • 公开/公告日2013-02-06

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20070240608

  • 发明设计人 今 真人;

    申请日2007-09-18

  • 分类号C23C14/34;C23C14/24;C23C14/54;C23C14/02;H01L21/203;

  • 国家 JP

  • 入库时间 2022-08-21 16:53:40

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