首页>
外国专利>
SYSTEMS AND METHODS PROVIDING EFFICIENT DETECTION OF BACK-SCATTERED ILLUMINATION IN MODULATION TRANSFER MICROSCOPY OR MICRO-SPECTROSCOPY
SYSTEMS AND METHODS PROVIDING EFFICIENT DETECTION OF BACK-SCATTERED ILLUMINATION IN MODULATION TRANSFER MICROSCOPY OR MICRO-SPECTROSCOPY
展开▼
机译:在调制传输显微镜或显微光谱中有效检测反散射照明的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A microscopy or micro-spectroscopy system is disclosed that includes a first light source, a second light source, a modulator, an optical assembly and a processor. The first light source is for providing a first illumination field at a first optical frequency ω1 and the second light source is for providing a second illumination field at a second optical frequency ω2. The modulator is for modulating a property of the second illumination field at a modulation frequency f of at least 100 kHz to provide a modulated second illumination field. The optical assembly includes focusing optics and an optical detector system. The focusing optics is for directing and focusing the first illumination field and the modulated second illumination field through an objective lens toward the common focal volume along an excitation path.
展开▼