首页> 外国专利> SYSTEMS AND METHODS PROVIDING EFFICIENT DETECTION OF BACK-SCATTERED ILLUMINATION IN MODULATION TRANSFER MICROSCOPY OR MICRO-SPECTROSCOPY

SYSTEMS AND METHODS PROVIDING EFFICIENT DETECTION OF BACK-SCATTERED ILLUMINATION IN MODULATION TRANSFER MICROSCOPY OR MICRO-SPECTROSCOPY

机译:在调制传输显微镜或显微光谱中有效检测反散射照明的系统和方法

摘要

A microscopy or micro-spectroscopy system is disclosed that includes a first light source, a second light source, a modulator, an optical assembly and a processor. The first light source is for providing a first illumination field at a first optical frequency ω1 and the second light source is for providing a second illumination field at a second optical frequency ω2. The modulator is for modulating a property of the second illumination field at a modulation frequency f of at least 100 kHz to provide a modulated second illumination field. The optical assembly includes focusing optics and an optical detector system. The focusing optics is for directing and focusing the first illumination field and the modulated second illumination field through an objective lens toward the common focal volume along an excitation path.
机译:公开了一种显微镜或显微光谱系统,其包括第一光源,第二光源,调制器,光学组件和处理器。第一光源用于以第一光学频率ω 1 提供第一照明场,第二光源用于以第二光学频率ω 2 。调制器用于以至少100kHz的调制频率f调制第二照明场的特性,以提供调制的第二照明场。光学组件包括聚焦光学器件和光学检测器系统。聚焦光学器件用于沿着物镜将第一照明场和调制后的第二照明场通过物镜引导和聚焦到激发路径上的公共焦点区域。

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