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ULTRA LOW POWER MEMORY CELL WITH A SUPPLY FEEDBACK LOOP CONFIGURED FOR MINIMAL LEAKAGE OPERATION

机译:超低功耗存储单元,具有反馈环,可实现最小泄漏操作

摘要

A memory cell with an internal supply feedback loop is provided herein. The memory cell includes a latch having two storage nodes Q and QB, and a supply node. A gating device couples the supply node of the latch to the supply voltage. The gating device is controlled by a feedback loop coming from storage node QB. Due to the aforementioned asymmetric topology, the writing of logic “1” and the writing of logic “0” are carried out differently. Contrary to standard SRAM cells, in the hold states, only the QB storage node presents a valid value of stored data. The feedback loop cuts off the supply voltage for the latch such that the latch is no longer an inverting latch. By cutting off the supply voltage at the stable hold states, while maintaining readability of the memory cell, leakage currents associated with the hold states are eliminated altogether.
机译:本文提供了具有内部电源反馈回路的存储单元。该存储单元包括具有两个存储节点Q和QB的锁存器以及供应节点。选通设备将锁存器的电源节点耦合到电源电压。门控设备由来自存储节点QB的反馈环路控制。由于前述的不对称拓扑,逻辑“ 1”的写入和逻辑“ 0”的写入被不同地执行。与标准SRAM单元相反,在保持状态下,只有QB存储节点会提供存储数据的有效值。反馈环路切断锁存器的电源电压,以使锁存器不再是反相锁存器。通过在稳定的保持状态下切断电源电压,同时保持存储单元的可读性,完全消除了与保持状态相关的泄漏电流。

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