APPARATUS AND METHODS FOR DETERMINATION OF THE HALF VALUE LAYER OF X-RAY BEAMS

摘要

Described is an apparatus for use in HVL measurement as well as methods of making measurements. One version of the apparatus is a cage structure having a central axis and a central opening defined by a filter encircling the central axis, with the filter having a thickness that varies peripherally around said central axis. The filter can be formed from multiple spaced-apart plates having varying thicknesses or can be formed from a cylinder having a continuously increasing thickness.