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Isolation structures for global shutter imager pixel, methods of manufacture and design structures

机译:全局快门成像器像素的隔离结构,制造和设计方法

摘要

Pixel sensor cells, e.g., CMOS optical imagers, methods of manufacturing and design structures are provided with isolation structures that prevent carrier drift to diffusion regions. The pixel sensor cell includes a photosensitive region and a gate adjacent to the photosensitive region. The pixel sensor cell further includes a diffusion region adjacent to the gate. The pixel sensor cell further includes an isolation region located below a channel region of the gate and about the photosensitive region, which prevents electrons collected in the photosensitive region to drift to the diffusion region.
机译:像素传感器单元(例如,CMOS光学成像器),制造方法和设计结构具有防止载流子漂移到扩散区的隔离结构。像素传感器单元包括感光区域和与感光区域相邻的栅极。像素传感器单元还包括与栅极相邻的扩散区域。像素传感器单元还包括位于栅极的沟道区下方并且在感光区周围的隔离区,其防止在感光区中收集的电子漂移到扩散区。

著录项

  • 公开/公告号US8507962B2

    专利类型

  • 公开/公告日2013-08-13

    原文格式PDF

  • 申请/专利权人 BRENT A. ANDERSON;MARK D. JAFFE;

    申请/专利号US20100897230

  • 发明设计人 BRENT A. ANDERSON;MARK D. JAFFE;

    申请日2010-10-04

  • 分类号H01L31/062;

  • 国家 US

  • 入库时间 2022-08-21 16:48:26

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