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System for performing electrical characterization of asynchronous integrated circuit interfaces
System for performing electrical characterization of asynchronous integrated circuit interfaces
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机译:用于执行异步集成电路接口的电气表征的系统
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摘要
An integrated circuit with a single-channel input/output (I/O) interface and a multi-channel I/O interface includes functional circuits that operate in different clock domains and a test circuit. For a single-channel I/O interface, the test circuit simulates read/write operations by bypassing the functional circuits and performs electrical characterization of the single-channel I/O interface. For a multi-channel I/O interface, the test circuit configures a plurality of channels of the multi-channel interface in a half-duplex mode and performs electrical characterization using data loop back by bypassing the functional circuits.
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