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Carrier concentration measuring device and carrier concentration measuring method

机译:载流子浓度测量装置和载流子浓度测量方法

摘要

A nondestructive carrier concentration measuring device (100) includes: a storage unit (101) that stores a correlation between the reflectance of an inorganic compound semiconductor against terahertz light and a carrier concentration; a light radiation unit (103) that irradiates the terahertz light (105) to the inorganic compound semiconductor as a sample; a detection unit (109) that detects reflected light (108) of the inorganic compound semiconductor against the irradiated terahertz light (105); a reflectance calculation unit (111) that compares the irradiated terahertz light (105) with the reflected light (108) and calculates an actual measurement value of the reflectance of the inorganic compound semiconductor; and a read unit (113) that refers to the stored correlation and reads the carrier concentration of the sample corresponding to the actual measurement value of the reflectance.
机译:一种非破坏性载流子浓度测量装置( 100 )包括:存储单元( 101 ),用于存储无机化合物半导体对太赫兹光的反射率与载流子浓度之间的相关性;将太赫兹光( 105 )照射到作为样品的无机化合物半导体的光照射单元( 103 );检测单元( 109 ),用于检测无机化合物半导体相对于太赫兹光( 105 )的反射光( 108 );反射率计算单元( 111 ),用于比较辐射的太赫兹光( 105 )与反射光( 108 )并计算实际测量值无机化合物半导体的反射率;读取单元( 113 ),其参考所存储的相关性并读取与反射率的实际测量值相对应的样品的载流子浓度。

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