首页> 外国专利> Dual bit line precharge architecture and method for low power dynamic random access memory (DRAM) integrated circuit devices and devices incorporating embedded DRAM

Dual bit line precharge architecture and method for low power dynamic random access memory (DRAM) integrated circuit devices and devices incorporating embedded DRAM

机译:用于低功率动态随机存取存储器(DRAM)集成电路设备和包含嵌入式DRAM的设备的双位线预充电架构和方法

摘要

A dual bit line precharge architecture and method for low power DRAM which provides the low operating voltage of a non-half supply voltage (VCC/2) precharge with the low memory array current consumption and low memory array noise spike of VCC/2 precharge techniques. The architecture and technique of the present invention provides both reference voltage (VSS) precharged sub arrays and VCC precharged sub arrays on the same DRAM memory either with or without the novel charge sharing or charge recycling circuitry between these two different sub arrays as disclosed herein.
机译:一种用于低功率DRAM的双位线预充电体系结构和方法,可提供非半电源电压(VCC / 2)预充电的低工作电压以及VCC / 2预充电技术的低存储阵列电流消耗和低存储阵列噪声尖峰。本发明的体系结构和技术在相同的DRAM存储器上提供参考电压(VSS)预充电的子阵列和VCC预充电的子阵列,在此公开的这两个不同的子阵列之间具有或不具有新颖的电荷共享或电荷再循环电路。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号