GRAPHENE DOMAIN MEASUREMENT SYSTEM AND METHOD USING AFM FRICTION MAPPING

摘要

The present invention relates to a graphene domain measurement system and method using AFM friction mapping, in which a graphene sample is rotated clockwise and is measured in order to allow the rotation angle from an initial measurement point to the final measurement point to be more than 180°; the same graphene sample is measured several times, e.g. at least five times, while the graphene sample is rotated clockwise; it is analyzed that the shading difference of the obtained friction mapping image relates to the direction in which the AFM tip progresses and the wrinkle direction of the graphene; and thus, the wrinkle direction of the graphene is obtained. In order to achieve the above goal, the present invention includes: measuring a graphene sample through an AFM microscope set to a Friction Mode, by using a measurement unit; adjusting a contrast range to the periphery of the graphene sample while an output unit outputs a friction mapping image; using the output unit to output a friction profile graph with respect to a specific portion obtained by horizontally cutting the friction mapping image; analyzing a relation between the direction in which the AFM tip progresses and the wrinkle direction of the graphene by using the friction profile graph; and determining the wrinkle direction of the graphene by using a contrast shading difference between each domain through the friction mapping image while using information analyzed by the determination unit.