首页> 外国专利> METHOD FOR DETERMINING A STRUCTURE OF A SEMICONDUCTOR MATERIAL HAVING PREDEFINED OPTO-ELECTRICAL PROPERTIES, METHOD FOR THE PRODUCTION THEREOF, AND SEMICONDUCTOR MATERIAL

METHOD FOR DETERMINING A STRUCTURE OF A SEMICONDUCTOR MATERIAL HAVING PREDEFINED OPTO-ELECTRICAL PROPERTIES, METHOD FOR THE PRODUCTION THEREOF, AND SEMICONDUCTOR MATERIAL

机译:确定具有预定光电性能的半导体材料的结构的方法,其制造方法和半导体材料

摘要

The invention relates to a method for setting opto-electrical properties of semiconductor materials in a predefined manner by determining a lattice constant, on which a photonic structuring of the semiconductor material is based. The photonic band gap resulting from the photonic structuring correlates in a predetermined manner with the electrical band gap inherently contained in the semiconductor material. The present invention further relates to a method for producing a corresponding semiconductor material by introducing a photonic structuring having the predetermined lattice constant into the semiconductor material. The present invention further relates to semiconductor materials that have the predetermined opto-electrical properties.
机译:本发明涉及一种通过确定晶格常数以预定方式设置半导体材料的光电特性的方法,该晶格常数是半导体材料的光子结构的基础。由光子结构化产生的光子带隙以预定的方式与半导体材料中固有地包含的电带隙相关。本发明还涉及一种通过将具有预定晶格常数的光子结构引入半导体材料中来制造相应的半导体材料的方法。本发明还涉及具有预定光电特性的半导体材料。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号