MEASUREMENT DEVICE AND METHOD FOR MEASURING THE SURFACE MICROSTRUCTURE PROFILE OR THE ROUGHNESS OF A SURFACE OF A BODY

摘要

The invention relates to a measurement device (10.1) for measuring a surface microstructure profile or the roughness of a surface (11) of a body (12), comprising a pin-shaped housing (13.1) that extends in the direction of the longitudinal housing axis (15) across a housing length (21). A measurement system (30) provided for detecting a deflection of a probing body constructed as a probe needle (25) in a measuring direction (26), and a bearing (24.1) or suspension, mounted so as to be moveable relative to the housing (13.1) in the measuring direction (26), for the probe needle (25) are arranged in the housing (13.1). The probe needle (25) extends parallel to the longitudinal housing axis (15) and has a probing end constructed as a probe tip (27). In the area of the probe needle (25), a pressing and supporting member (35.1), by means of which the measurement device (10.1) can be pressed against and supported on the surface (11), is formed in the area of one end (19) of the housing (13.1). At least in one housing section (20), starting from the aforementioned end (19) of the housing over the entire housing length (21), the housing (13.1) spans a maximum outside diameter (22) less than or equal to 20 mm in an imaginary transverse plane (29) running perpendicular to the longitudinal housing axis (15). The probe needle (25) is arranged substantially inside an imaginary projection (23), running parallel to the longitudinal housing axis (15), of the housing section (20) having the maximum outside diameter (22).