首页> 外国专利> METHOD FOR TEMPORARILY LOCKING A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE, MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE FOR CARRYING OUT THE METHOD, AND ASSEMBLY OF A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE AND A MEASUREMENT OBJECT

METHOD FOR TEMPORARILY LOCKING A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE, MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE FOR CARRYING OUT THE METHOD, AND ASSEMBLY OF A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE AND A MEASUREMENT OBJECT

机译:暂时锁定微结构和/或粗糙度测量设备的方法,实施该方法的微结构和/或粗糙度测量设备,以及微结构和/或粗糙度测量设备和测量的组装

摘要

The invention relates to a method for temporarily locking a measuring device part, containing a measuring sensor, of a microstructure and/or roughness measuring device in a borehole of a measurement object that is delimited by a borehole wall (1). The invention also relates to a microstructure and/or roughness measuring device for carrying out the method according to the invention. The invention also relates to an assembly of a microstructure and/or roughness measuring device according to the invention and a measurement object having a borehole delimited by a borehole wall (1).
机译:本发明涉及一种用于将微结构和/或粗糙度测量装置的包含测量传感器的测量装置部件临时锁定在由钻孔壁(1)界定的测量对象的钻孔中的方法。本发明还涉及用于执行根据本发明的方法的微结构和/或粗糙度测量装置。本发明还涉及根据本发明的微结构和/或粗糙度测量装置的组件以及具有由钻孔壁(1)界定的钻孔的测量对象。

著录项

  • 公开/公告号EP3108204A1

    专利类型

  • 公开/公告日2016-12-28

    原文格式PDF

  • 申请/专利权人 BREITMEIER MESSTECHNIK GMBH;

    申请/专利号EP20160717541

  • 发明设计人 BREITMEIER ULRICH;

    申请日2016-03-10

  • 分类号G01B11/30;G01B21/30;G01B5/28;

  • 国家 EP

  • 入库时间 2022-08-21 14:02:24

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