The present invention provides a measurement apparatus including a phase detection unit configured to detect, from interfering light of light reflected by a reference surface and light reflected by a test surface, a phase corresponding to an optical path length between the reference surface and the test surface, a refractive index detection unit configured to detect a refractive index of a space between the reference surface and the test surface, and a processing unit configured to obtain the distance from a first phase and a first refractive index detected when the wavelength of light from the light source is a first wavelength, a second phase and a second refractive index detected when the wavelength of light from the light source is a second wavelength, and a third phase at a synthetic wavelength of the first wavelength and the second wavelength.
展开▼
