SHARED BOARD STRUCTURE OF A PROBE CARD AND A METHOD FOR MANUFACTURING A SHARED BOARD OF THE PROBE CARD CAPABLE OF FORMING A PROBE UNIT WITH A UNIT BLOCK

摘要

PURPOSE: A shared board structure of a probe card and a method for manufacturing a shared board of the probe card are provided to reduce manufacturing costs by minimizing precise multilayer ceramic materials used in the probe card.;CONSTITUTION: A shared board structure of a probe card includes a frame rigid body and a probe unit of a plurality of unit blocks. The probe unit includes a probe(100), a nonconductive dummy board(200) of the unit block, a PCB, and a wire bonding(400). The probe is fixed to an electric circuit formed on one side of the nonconductive dummy board. A circuit pad is formed on both sides of the PCB. A circuit pattern is formed on the PCB. The dummy board is fixed to the upper side of the PCB. The electric circuit of the dummy board is electrically connected to the circuit pad of the PCB by the wire bonding.;COPYRIGHT KIPO 2013