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PARALLEL TEST CIRCUIT AND PARALLEL TEST METHOD OF A SEMICONDUCTOR MEMORY DEVICE CAPABLE OF DETERMINING THE NORMALITY OF A MEMORY CELL
PARALLEL TEST CIRCUIT AND PARALLEL TEST METHOD OF A SEMICONDUCTOR MEMORY DEVICE CAPABLE OF DETERMINING THE NORMALITY OF A MEMORY CELL
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机译:能够确定存储单元正常性的半导体存储器件的并行测试电路和并行测试方法
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摘要
PURPOSE: A parallel test circuit and parallel test method of a semiconductor memory device are provided to shorten a memory cell test time by simultaneously testing sub-banks included in one bank.;CONSTITUTION: A first memory bank (100) includes a first sub-bank (10), a second sub-bank (20), a compression part (30), and an output part (40). A global line and a test global line of the second sub-bank are composed of a plurality of lines. The compression part compares and compresses each data loaded in the global lines and data loaded in the test global lines of the second sub-bank and outputs a compression result. The output part generates a test output signal in response to a strobe signal and the compression result and outputs the test output signal to an I/O pad.;COPYRIGHT KIPO 2013;[Reference numerals] (10) First sub-bank; (100) First memory bank; (20) Second sub-bank; (30) Compression part; (40) Output part
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