首页> 外国专利> METHOD FOR FORMING NITRIDE THIN FILM ON m-PLANE SAPPHIRE SUBSTRATE AND NITRIDE SEMICONDUCTOR MANUFACTURED BY THE SAME

METHOD FOR FORMING NITRIDE THIN FILM ON m-PLANE SAPPHIRE SUBSTRATE AND NITRIDE SEMICONDUCTOR MANUFACTURED BY THE SAME

机译:在m-平面蓝宝石衬底上形成氮化物薄膜的方法和由其制造的氮化物半导体

摘要

PURPOSE: A method for forming a nitride thin film on an m-surface sapphire substrate and the nitride semiconductor manufactured thereby are provided to increase photoluminescence intensity by epitaxially re-growing an etching surface after a heat etching process. CONSTITUTION: An M-surface sapphire substrate(10) is nitrified. A nitride thin film(32) is formed by epitaxially growing the nitrified M-surface sapphire substrate with nitride materials under a high temperature hydrogen atmosphere. The M-surface sapphire substrate is nitrified within an MOCVD(Metalorganic Chemical Vapor Deposition) chamber in an atmosphere including hydrogen gas and ammonia gas for over 5 minutes. The growth temperature for the nitrified M-surface sapphire substrate is 1030C. The nitride materials include GaN(Gallium Nitride).
机译:用途:提供一种在m表面蓝宝石衬底上形成氮化物薄膜的方法以及由其制造的氮化物半导体,以通过在热蚀刻工艺之后外延地重新生长蚀刻表面来增加光致发光强度。组成:M表面的蓝宝石衬底(10)被硝化。通过在高温氢气氛下用氮化物材料外延生长氮化的M面蓝宝石衬底来形成氮化物薄膜(32)。在包括氢气和氨气的气氛中的MOCVD(金属有机化学气相沉积)室内,将M表面的蓝宝石衬底氮化5分钟以上。氮化的M面蓝宝石衬底的生长温度为1030℃。氮化物材料包括GaN(氮化镓)。

著录项

  • 公开/公告号KR101277365B1

    专利类型

  • 公开/公告日2013-06-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20110010469

  • 发明设计人 이성남;신수진;오동섭;

    申请日2011-02-07

  • 分类号H01L33/16;H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:58

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