首页> 外国专利> FABRICATION METHOD OF LIGHT EMITTING DEVICE HAVING SCATTERING CENTER USING ANODIC ALUMINUM OXIDE AND LIGHT EMITTING DEVICE THEREBY

FABRICATION METHOD OF LIGHT EMITTING DEVICE HAVING SCATTERING CENTER USING ANODIC ALUMINUM OXIDE AND LIGHT EMITTING DEVICE THEREBY

机译:采用阳极氧化铝的具有散射中心的发光装置的制备方法及由此产生的发光装置

摘要

the present invention includes a first conductive type semiconductor layer, the second conductivity type semiconductor layer between the active layer and that the A method for manufacturing a light emitting device made by forming on a substrate, the first conductive type semiconductor layer on the substrate and the growth of the primary phase, comprising the steps of: forming an aluminum layer on the first conductive semiconductor layer, an anodizing carried out by forming a plurality of holes formed in the aluminum layer, etching and patterning such that a portion of the first conductive type semiconductor layer by etching the plurality of holes are formed in the aluminum layer to the shadow mask, the first conductive type removing the aluminum layer remaining on the semiconductor layer, the first conductive type semiconductor layer and the second growth step of the active layer and forming a second conductive type semiconductor layer on the first conductive semiconductor layer provides a light emitting device manufacturing method comprising. ; According to the present invention, the light generated by the active layer in the light emitting element a first conductive type first conductive type semiconductor layer and a refractive index of the air layer in the semiconductor layer other because it is scattered by the scattering center can be made to efficiently released to the outside, thereby improving the light efficiency.
机译:本发明包括第一导电型半导体层,位于有源层之间的第二导电型半导体层和通过在基板上形成的发光器件的制造方法,在基板上的第一导电型半导体层和初级相的生长,包括以下步骤:在第一导电半导体层上形成铝层,通过形成在铝层中形成的多个孔进行阳极氧化,蚀刻和图案化以使第一导电类型的一部分通过蚀刻在铝层中形成的多个孔来形成半导体层至荫罩,第一导电类型去除残留在半导体层上的铝层,第一导电类型半导体层和有源层的第二生长步骤并形成在第一导电半导体层上提供第二导电类型半导体层包括一种发光器件的制造方法。 ;根据本发明,由发光元件中的有源层,第一导电类型的第一导电类型半导体层产生的光以及半导体层中的空气层的折射率可以是其他的,因为它被散射中心散射。从而有效地释放到外部,从而提高了光效率。

著录项

  • 公开/公告号KR101316120B1

    专利类型

  • 公开/公告日2013-10-11

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20060136681

  • 发明设计人 김창연;윤여진;

    申请日2006-12-28

  • 分类号H01L33/02;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:20

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