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Cu-Mn ALLOY SPUTTERING TARGET MATERIAL, THIN FILM TRANSISTOR WIRE AND THIN FILM TRANSISTOR USING THE SAME
Cu-Mn ALLOY SPUTTERING TARGET MATERIAL, THIN FILM TRANSISTOR WIRE AND THIN FILM TRANSISTOR USING THE SAME
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机译:铜锰合金溅射靶材,薄膜晶体管电线和薄膜晶体管
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摘要
PURPOSE: A Cu-Mn alloy sputtering target material, a thin film transistor wire and a thin film transistor using the same are provided to secure high operation by using amorphous silicon semiconductor. CONSTITUTION: A Cu-Mn alloy sputtering target(10) includes Mn of 8-30 atom%. The average grain size of Cu-Mn alloy is 10-50 Mm. A stack structure is formed on a substrate. The stack structure includes a Cu-Mn alloy film and a Cu film.
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