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The method of determining relevance values for a detection of an error on a chip, a method for determining an error probability of a location on a chip and computer program
The method of determining relevance values for a detection of an error on a chip, a method for determining an error probability of a location on a chip and computer program
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机译:确定用于检测芯片上的错误的相关性值的方法,用于确定芯片上的位置的错误概率的方法和计算机程序
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摘要
The method of determining relevance values (r (i, m)), wherein each of relevance value of a relevance of a combination ((i, m)) of an input node (i) a first number (i) from input node with a measuring node (m) a second number (m) of measuring node for a detection of an error on a chip, the method comprises the steps of:Applying (1710) a third number (k) of tests on the first number (i) of input node, wherein each test (k) of the third number (k) of tests for each input node (i) a test input selection (u (k, i)) defined;Measuring (1720) for each test (k) of the third number (k) from tests, a signal to each of the second number (m) of measuring node, in order for each measuring node (m) of the second number (m) of measuring node a third number (k) to obtain from measured values, each measured value (y (k, m)) the test (k), for which it was measured, and the measuring node (m), to which it was measured, is assigned to..
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