Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining an error probability of a location on a chip

摘要

A method for determining relevance values (r (i, m)), wherein each of relevance value of a relevance of a combination ((i, m)) of an input node (i) a first number (i) from input node with a measuring node (m) a second number (m) of measuring node for a detection of an error on a chip, the method comprises the steps of:Applying (1710) a third number (k) of tests on the first number (i) of input node, wherein each test (k) of the third number (k) of tests for each input node (i) a test input selection (u (k, i)) defined;Measuring (1720) for each test (k) of the third plurality (k) from tests, a signal to each of the second number (m) of measuring node, in order for each measuring node (m) of the second number (m) of measuring node a third number (k) to obtain from measured values, each measured value (y (k, m)) the test (k), for which it was measured, and the measuring node (m), to which it was measured,..