Method for identifying inductive load in electric switch for connecting to supply voltage source, involves evaluating voltage potential at circuit nodes of inductive load with switch during testing phase

摘要

The method involves evaluating voltage potential at the circuit nodes (P) of the inductive load (L) with a switch (T) during a testing phase. The test phase is temporally defined by a short test pulse, which is connected to the circuit nodes with the open electric switch, where a voltage value of the test pulse is smaller than the smallest voltage potential (UL) occurring at the circuit nodes with the closed switch. The course of the voltage potential is evaluated by the test pulse, which is caused in the circuit nodes.