首页> 外国专利> Making semiconductor structure, comprises forming first opening in dielectric layer, forming opening in dielectric material, forming seed layer within first opening, forming masking layer, and forming fill layer over seed layer

Making semiconductor structure, comprises forming first opening in dielectric layer, forming opening in dielectric material, forming seed layer within first opening, forming masking layer, and forming fill layer over seed layer

机译:制作半导体结构,包括在介电层中形成第一开口,在介电材料中形成开口,在第一开口内形成种子层,形成掩模层以及在种子层上方形成填充层。

摘要

The method of making a semiconductor structure (102), comprises: forming a first opening in a dielectric layer (140); forming an opening in the dielectric material; forming a seed layer within the first opening; forming a masking layer over the seed layer; patterning the masking layer to forth a second opening over the first opening; forming a fill layer over the seed layer; causing the seed layer to react with the dielectric layer form a barrier layer (130); removing the patterned masking layer, removing that portion of the seed layer uncovered by removing the patterned masking layer. The method of making a semiconductor structure (102), comprises: forming a first opening in a dielectric layer (140); forming an opening in the dielectric material; forming a seed layer within the first opening; forming a masking layer over the seed layer; patterning the masking layer to forth a second opening over the first opening; forming a fill layer over the seed layer; causing the seed layer to react with the dielectric layer form a barrier layer (130); removing the patterned masking layer, removing that portion of the seed layer uncovered by removing the patterned masking layer. The seed layer comprises a base element and an additional element. The additional element is = 10 at.%. The conductive structure is a bond pad. The masking layer comprises a photoresist layer. The seed layer comprises an alloy, which comprises the base element and the additional element. The fill layer forms a bond pad. The step of causing the seed layer comprises thermal annealing step, and causing the additional element to react with the dielectric layer. The step of forming the fill layer comprises an electrodeposition process. The exposed seed layer is present within the opening. The base element is a first metallic element. The additional element is a second metallic element different from the first metallic element. An independent claim is included for a semiconductor structure.
机译:制造半导体结构的方法(102)包括:在介电层(140)中形成第一开口;以及在第一开口中形成第一开口。在介电材料中形成开口;在第一开口内形成种子层;在种子层上形成掩模层;构图掩模层以在第一开口上方形成第二开口;在种子层上形成填充层;使种子层与电介质层反应,形成阻挡层(130);去除图案化的掩模层,通过去除图案化的掩模层去除种子层中未被覆盖的那部分。制造半导体结构的方法(102)包括:在介电层(140)中形成第一开口;以及在第一开口中形成第一开口。在介电材料中形成开口;在第一开口内形成种子层;在种子层上形成掩模层;构图掩模层以在第一开口上方形成第二开口;在种子层上形成填充层;使种子层与电介质层反应,形成阻挡层(130);去除图案化的掩模层,通过去除图案化的掩模层去除种子层中未被覆盖的那部分。种子层包括基础元素和附加元素。附加元素为= 10 at。%。导电结构是焊盘。掩模层包括光致抗蚀剂层。种子层包括合金,该合金包括基础元素和附加元素。填充层形成焊盘。引起籽晶层的步骤包括热退火步骤,并使附加元素与介电层反应。形成填充层的步骤包括电沉积工艺。暴露的种子层存在于开口内。基础元件是第一金属元件。附加元件是不同于第一金属元件的第二金属元件。对于半导体结构包括独立权利要求。

著录项

  • 公开/公告号DE102012110060A1

    专利类型

  • 公开/公告日2013-05-23

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE201210110060

  • 发明设计人 KRIZ JAKOB;URBANSKY NORBERT;

    申请日2012-10-22

  • 分类号H01L21/768;H01L23/522;

  • 国家 DE

  • 入库时间 2022-08-21 16:21:49

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