首页> 外国专利> Method and device for measuring a local field of gravity, a wave of material on a chip integrated atomic with separation micro - of the atoms.

Method and device for measuring a local field of gravity, a wave of material on a chip integrated atomic with separation micro - of the atoms.

机译:用于测量局部重力场的方法和设备,该局部重力场是芯片上的材料波将原子与原子的分离微观结合在一起。

摘要

The method involves modifying and spatially separating an internal state of atoms to lead the atoms in an intermediate state, where the internal state and another internal state are spatially separated by a distance. The internal states are determined for a determination time during which the atoms accumulate a phase difference to lead the atoms in another intermediate state. The atoms are transferred and placed in a final state. The phase difference is determined by interference of multiple internal states based on measuring the number of atoms found in the internal states. An independent claim is also included for a matter-wave type gravimeter comprising an electronic chip.
机译:该方法包括修改和空间分离原子的内部状态,以使原子处于中间状态,其中内部状态和另一个内部状态在空间上隔开一定距离。在确定时间内确定内部状态,在确定时间内原子积累相位差以使原子处于另一种中间状态。原子被转移并置于最终状态。通过测量内部状态中发现的原子数,通过多个内部状态的干扰确定相位差。对于包括电子芯片的物质波型重力仪也包括独立权利要求。

著录项

  • 公开/公告号FR2968088B1

    专利类型

  • 公开/公告日2012-12-28

    原文格式PDF

  • 申请/专利权人 THALES;

    申请/专利号FR20100004657

  • 发明设计人 CHRISTINE GUERLIN;SYLVAIN SCHWARTZ;

    申请日2010-11-30

  • 分类号G01V7/02;G01P15/00;

  • 国家 FR

  • 入库时间 2022-08-21 16:21:14

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