首页> 外国专利> SUBSTRATE CRACK DETECTION APPARATUS, POLISHING APPARATUS INCLUDING THE SAME, AND SUBSTRATE CRACK DETECTION METHOD

SUBSTRATE CRACK DETECTION APPARATUS, POLISHING APPARATUS INCLUDING THE SAME, AND SUBSTRATE CRACK DETECTION METHOD

机译:基板裂纹检测装置,包括其的抛光装置以及基板裂纹检测方法

摘要

PROBLEM TO BE SOLVED: To provide a detection apparatus to detect a crack of a substrate during a polishing process or before and after the polishing process.;SOLUTION: The detection apparatus includes: a sound sensor or vibration sensor 10 disposed inside a substrate retainer T to retain a substrate W; a control part 13 to receive all the time an output signal from the sound sensor or vibration sensor 10; and a storage part 15 to store, as a reference value, sound or vibration during polishing in a state in which the substrate W is not cracked. The control part 13 detects a crack of the substrate W by comparing a value of at least one of the sound and vibration to be received and the reference value stored in the storage part 15.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种检测装置,以在抛光过程中或抛光过程之前和之后检测衬底的裂纹。解决方案:该检测设备包括:声音传感器或振动传感器10,其布置在衬底保持架T内。保持基板W;控制部分13始终接收来自声音传感器或振动传感器10的输出信号;存储部15将基板W不破裂的状态下的研磨时的声音或振动作为基准值存储。控制部分13通过将要接收的声音和振动中的至少一个的值与存储在存储部分15中的参考值进行比较来检测基板W的裂缝;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014172161A

    专利类型

  • 公开/公告日2014-09-22

    原文格式PDF

  • 申请/专利权人 EBARA CORP;

    申请/专利号JP20130049866

  • 发明设计人 MARUYAMA TORU;MOTOJIMA YASUYUKI;

    申请日2013-03-13

  • 分类号B24B37/34;H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:54

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号