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Temperature measurement method for temperature measurement probe , using the same temperature and measurement system

机译:使用相同温度和测量系统的温度测量探头的温度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a probe for temperature measurement that does not require any troublesome operations for setting optical path lengths, restricts temperature measurement objects less, and has a wide scope of application.;SOLUTION: The probe for temperature measurement uses interference of low coherence light. The probe for temperature measurement includes: an abutment member 71 which is abutted with the surface of a temperature measurement object, and assimilates with the temperature measurement object thermally; a collimator 72 which radiates measuring light 74 composed of low coherence light to the abutment member 71, and receives reflected light 75a from the surface of the abutment member 71 and reflected light 75b from its backside, respectively; and a cylindrical member 73 which regulates the interval between the abutment member 71 and the collimator 72 to a predetermined length, and isolates optical paths of the measuring light 74 and the rays of the reflected light 75a, 75b from an atmosphere where the measurement object is put.;COPYRIGHT: (C)2011,JPO&INPIT
机译:要解决的问题:提供一种无需任何麻烦的设置光程长度的温度测量探头,就可以减少对温度测量对象的限制,并具有广泛的应用范围。低相干光。用于温度测量的探针包括:抵接构件71,其与温度测量对象的表面抵接,并且与温度测量对象热结合。准直仪72将由低相干性光构成的测量光74照射到抵接部件71,并分别从抵接部件71的表面接收反射光75a和从其背面接收反射光75b。圆筒形部件73,其将抵接部件71和准直仪72之间的间隔调节为预定长度,并且使测量光74的光路和反射光75a,75b的光线与测量对象所在的环境隔离。版权所有:(C)2011,日本特许厅和INPIT

著录项

  • 公开/公告号JP5591565B2

    专利类型

  • 公开/公告日2014-09-17

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20100055871

  • 发明设计人 松土 龍夫;

    申请日2010-03-12

  • 分类号G01K11/12;

  • 国家 JP

  • 入库时间 2022-08-21 16:15:29

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