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PROBE FOR TEMPERATURE MEASUREMENT, TEMPERATURE MEASUREMENT SYSTEM, AND TEMPERATURE MEASUREMENT METHOD USING THE SAME WITH A WIDENED TEMPERATURE MEASUREMENT RANGE
PROBE FOR TEMPERATURE MEASUREMENT, TEMPERATURE MEASUREMENT SYSTEM, AND TEMPERATURE MEASUREMENT METHOD USING THE SAME WITH A WIDENED TEMPERATURE MEASUREMENT RANGE
PURPOSE: A probe for temperature measurement, a temperature measurement system, and a temperature measurement method using the same are provided to indirectly measure the temperature of a target object using a temperature measurement member.;CONSTITUTION: A probe for temperature measurement comprises a temperature measurement member, a light irradiating/receiving unit, and a cylindrical member. The temperature measurement member is in contact with the surface of a target object. The light irradiating/receiving unit irradiates measurement light(74) to the temperature measurement member and receives the lights(75a,75b) reflected from the surfaces of the temperature measurement member. The cylindrical member isolates the optical path of the measurement and reflected lights from the target object.;COPYRIGHT KIPO 2012
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