Thickness information acquisition device , thickness information acquisition method , thickness information acquisition program and microscope

摘要

PROBLEM TO BE SOLVED: To obtain thickness information of samples with sufficient precision at short times.;SOLUTION: In the present invention, because a correlation condition for a reference image of acquired phase difference images is computed and, according to the correlation condition concerned, thickness information of tissue slice TS is acquired, thickness information of the tissue slice TS is acquirable from one phase difference image, thickness information reflecting distribution along the thickness direction of samples is also acquirable, and thus thickness information is acquirable with sufficient precision at short times.;COPYRIGHT: (C)2011,JPO&INPIT