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In the manufacture of integrated circuits , ultrafast laser annealing with reduced pattern density effect

机译:在集成电路制造中,降低图案密度效应的超快激光退火

摘要

PROBLEM TO BE SOLVED: To reduce the pattern density effect with poly-gate laser annealing.;SOLUTION: Laser annealing comprises a step of scanning a patterned surface 12 of a substrate with at least one first laser beam 168. This at least one first laser beam heats the patterned surface up to non-melting temperature Tnonmelt, which is within 400°C from melting temperature Tmelt. This method further comprises a step of scanning the patterned surface with at least one second laser beam 268 in relation with the first laser beam. The at least one second laser beam is a pulsed form and heats the patterned surface up to the melting temperature from the non-melting temperature prepared by the at least one first laser beam.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:为了降低多栅激光退火的图案密度效应。解决方案:激光退火包括用至少一个第一激光束168扫描衬底的图案化表面12的步骤。光束将图案化的表面加热到非熔化温度T nonmelt ,该温度距熔化温度T melt 不到400°C。该方法还包括以下步骤:相对于第一激光束用至少一个第二激光束268扫描图案化的表面。至少一个第二激光束为脉冲形式,并将图案化的表面从由至​​少一个第一激光束制备的非熔融温度加热到熔融温度。;版权所有:(C)2013,JPO&INPIT

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