首页> 外国专利> Being the method of measuring the position or inclination of the aforementioned projection aspect for the aforementioned projection optical system making use of the projector which has the projection optical system which projects the picture light which displays the position of the projection aspect for the projector and the projection optical system which execute the image processing method and its image processing

Being the method of measuring the position or inclination of the aforementioned projection aspect for the aforementioned projection optical system making use of the projector which has the projection optical system which projects the picture light which displays the position of the projection aspect for the projector and the projection optical system which execute the image processing method and its image processing

机译:作为利用投影仪的上述投影光学系统的上述投影方式的位置或倾斜度的测定方法,该投影仪具有投影显示该投影机的投影方式的位置的图像光的投影光学系统。执行图像处理方法的光学系统及其图像处理

摘要

PPROBLEM TO BE SOLVED: To provide the technology for easily and precisely measuring an object to be projected by using projected light of a projection optical system. PSOLUTION: A projection optical system 150 of a projector 100 projects a pattern image MI for measurement which includes a measurement line LM1 onto a projection screen SC. An image pickup part 180 photographs a projected measurement projection image MIp. An image pickup measurement line detection part 121 detects from a photography image SI a picked up image measurement line LM1s corresponding to the measurement line LM1. A projection measurement line detection part 122 obtains a projection measurement line LM1p on the projection screen SC from a picked up image measurement line LM1 and determines a position and a tilt angle of the projection surface. The projection measurement line LM1p is obtained as an intersection of a virtual plane PA defined by a beam representing the measurement line LM1 and a virtual plane SA defined by a main point PP of an image pickup part 180 and an image pickup measurement line LM1s. PCOPYRIGHT: (C)2010,JPO&INPIT
机译:

要解决的问题:提供一种通过使用投影光学系统的投影光来轻松,精确地测量要投影的对象的技术。解决方案:投影仪100的投影光学系统150将包括测量线LM1的用于测量的图案图像MI投影到投影屏SC上。图像拾取部180拍摄投影的测量投影图像MIp。摄像测量线检测部121从摄影图像SI中检测与测量线LM1对应的摄像图像测量线LM1s。投影测量线检测部分122从拾取的图像测量线LM1获得投影屏幕SC上的投影测量线LM1p,并确定投影表面的位置和倾斜角。投影测量线LM1p作为由代表测量线LM1的光束限定的虚拟平面PA与由图像拾取部180的主点PP和图像拾取测量线LM1s限定的虚拟平面SA的交点而获得。

版权:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP5540493B2

    专利类型

  • 公开/公告日2014-07-02

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20080279287

  • 发明设计人 古井 志紀;

    申请日2008-10-30

  • 分类号H04N5/74;G03B21;G09G5;

  • 国家 JP

  • 入库时间 2022-08-21 16:13:10

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