首页> 外国专利> MEASUREMENT METHOD OF POSITION OR TILT OF PROJECTION SURFACE AGAINST PROJECTION OPTICAL SYSTEM, CORRECTION METHOD OF PROJECTION IMAGE USING THE MEASUREMENT METHOD, AND PROJECTOR FOR PERFORMING THE CORRECTION METHOD

MEASUREMENT METHOD OF POSITION OR TILT OF PROJECTION SURFACE AGAINST PROJECTION OPTICAL SYSTEM, CORRECTION METHOD OF PROJECTION IMAGE USING THE MEASUREMENT METHOD, AND PROJECTOR FOR PERFORMING THE CORRECTION METHOD

机译:针对投影光学系统的投影表面的位置或倾斜度的测量方法,使用该测量方法的投影图像的校正方法以及执行该校正方法的投影仪

摘要

PROBLEM TO BE SOLVED: To provide the technology for easily and precisely measuring an object to be projected by using projected light of a projection optical system.;SOLUTION: A projection optical system 150 of a projector 100 projects a pattern image MI for measurement which includes a measurement line LM1 onto a projection screen SC. An image pickup part 180 photographs a projected measurement projection image MIp. An image pickup measurement line detection part 121 detects from a photography image SI a picked up image measurement line LM1s corresponding to the measurement line LM1. A projection measurement line detection part 122 obtains a projection measurement line LM1p on the projection screen SC from a picked up image measurement line LM1 and determines a position and a tilt angle of the projection surface. The projection measurement line LM1p is obtained as an intersection of a virtual plane PA defined by a beam representing the measurement line LM1 and a virtual plane SA defined by a main point PP of an image pickup part 180 and an image pickup measurement line LM1s.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种通过使用投影光学系统的投影光来容易且精确地测量要投影的物体的技术。解决方案:投影仪100的投影光学系统150投影用于测量的图案图像MI,包括测量线LM1到投影屏SC上。图像拾取部180拍摄投影的测量投影图像MIp。摄像测量线检测部121从摄影图像SI中检测与测量线LM1对应的摄像图像测量线LM1s。投影测量线检测部分122从拾取的图像测量线LM1获得投影屏幕SC上的投影测量线LM1p,并确定投影表面的位置和倾斜角。投影测量线LM1p作为由代表测量线LM1的光束定义的虚拟平面PA与由图像拾取部分180的主点PP和图像测量线LM1s定义的虚拟平面SA的交点而获得。版权:(C)2010,日本特许厅和INPIT

著录项

  • 公开/公告号JP2010109659A

    专利类型

  • 公开/公告日2010-05-13

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20080279287

  • 发明设计人 FURUI SHIKI;

    申请日2008-10-30

  • 分类号H04N5/74;G03B21/00;G09G5/00;

  • 国家 JP

  • 入库时间 2022-08-21 19:06:04

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号