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Etchant, etching method and etching agents prepared solution

机译:蚀刻剂,蚀刻方法及蚀刻剂配制溶液

摘要

The present invention is directed to provide an etching agent for a semiconductor substrate, which is capable of etching a tungsten (W)-based metal film on a semiconductor substrate and an etching method using relevant etching agent, and relates to a liquid for preparing the etching agent for a semiconductor substrate composed of a solution comprising (A) hydrogen peroxide, (B) a phosphonic acid chelating agent having a hydroxyl group and not having nitrogen atom, (C) a basic compound, and (D-2) 0.01 to 3 % by weight of two or more kinds of anion species other than phosphonic acid chelating agents having a hydroxyl group and not having nitrogen atom, in which anion species have no oxidizing power, an etching method characterized by etching a tungsten (W)-based metal film on a semiconductor substrate using relevant etching agent for a semiconductor substrate, further, a solution comprising (B) a phosphonic acid chelating agent having a hydroxyl group and not having nitrogen atom, (C) a basic compound, and (D-2) anion species other than phosphonic acid chelating agents having a hydroxyl group and not having a hydroxyl group, in which anion species have no oxidizing power.
机译:本发明的目的是提供一种用于半导体衬底的蚀刻剂,其能够在半导体衬底上蚀刻钨(W)基金属膜,以及使用相关蚀刻剂的蚀刻方法,并且涉及一种用于制备半导体衬底的蚀刻剂。用于半导体衬底的蚀刻剂,其由以下溶液组成:(A)过氧化氢,(B)具有羟基且不具有氮原子的膦酸螯合剂,(C)碱性化合物和(D-2)0.01至以蚀刻钨(W)基为特征的蚀刻方法,除具有羟基且不具有氮原子的膦酸螯合剂以外的2种以上的阴离子种类为3重量%。半导体基板上的金属膜,其使用用于半导体基板的相关蚀刻剂,此外,溶液包含(B)具有羟基且不具有氮原子的膦酸螯合剂,(C)a碱性化合物,以及除了具有羟基但不具有羟基的膦酸螯合剂以外的(D-2)阴离子种类,其中阴离子种类没有氧化能力。

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