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ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF PACKAGE-ON-PACKAGE (POP) DURING ELECTRICAL TESTING
ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF PACKAGE-ON-PACKAGE (POP) DURING ELECTRICAL TESTING
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机译:电气测试过程中用于包装上封装(POP)的光学背面故障分析的组件
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摘要
A method and apparatus for testing a package-on-package digital device is provided. The method includes the steps of: affixing a top device onto a wing board; affixing a bottom device onto the wing board; connecting the top side solderballs of the bottom package to the bond fingers of the wing board. The wing board is then mounted onto a flat top socket. Once the mounting has been completed, the testing begins, and may use a solid immersion lens or optical diagnostic tool. The configuration of the flat top socket and wing board allows the optical diagnostic tool full access to the bottom device for the testing process and failure analysis.
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