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ATOMIC LAYER DEPOSITION OF HIGH PERFORMANCE ANTI REFLECTION COATINGS ON DELTA-DOPED CCDS

机译:掺有DELTA的CCDS上高性能防反射涂层的原子层沉积

摘要

A back-illuminated silicon photodetector has a layer of Al2O3 deposited on a region of a silicon oxide surface that is left uncovered, while deposition is inhibited in another region by a contact shadow mask. The Al2O3 layer is an antireflection coating. In addition, the Al2O3 layer can also provide a chemically resistant separation layer between the silicon oxide surface and additional antireflection coating layers. In one embodiment, the silicon photodetector has a delta-doped layer near (within a few nanometers of) the silicon oxide surface. The Al2O3 layer is expected to provide similar antireflection properties and chemical protection for doped layers fabricated using other methods, such as MBE, ion implantation and CVD deposition.
机译:背照式硅光电探测器具有一层Al 2 O 3 ,该层沉积在未被覆盖的氧化硅表面区域上,而沉积则被另一区域抑制接触式荫罩。 Al 2 O 3 层是抗反射涂层。此外,Al 2 O 3 层还可以在氧化硅表面和其他防反射涂层之间提供耐化学腐蚀的隔离层。在一实施例中,硅光电检测器在氧化硅表面附近(数纳米之内)具有δ掺杂层。 Al 2 O 3 层有望为使用其他方法(例如MBE,离子注入和CVD沉积)制造的掺杂层提供类似的抗反射特性和化学保护。

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