首页> 外国专利> MEASURING INSTRUMENT, MEASUREMENT SYSTEM, MEASUREMENT POSITION POSITIONING METHOD AND MEASUREMENT POSITION POSITIONING PROGRAM USING THE SAME

MEASURING INSTRUMENT, MEASUREMENT SYSTEM, MEASUREMENT POSITION POSITIONING METHOD AND MEASUREMENT POSITION POSITIONING PROGRAM USING THE SAME

机译:使用该仪器的测量仪器,测量系统,测量位置定位方法和测量位置定位程序

摘要

A measurement system is capable of accurately aligning the corresponding measurement points of a plurality of measurement targets to evaluate the measurement targets from measurement results. A measurement system includes a measuring instrument and a PC, the measuring instrument includes a spectroscopic unit that measures a measurement point of a measurement target and a camera that images surroundings in real-time. The PC displays an evaluation image of continuous image information, which is imaged and displayed by the camera on a display screen so as to be superimposed on a reference image of still image information, which has been imaged and stored in memory. By comparing the data obtained by measuring the measurement point in the evaluation image when both images overlap each other and the measurement data of the point in the reference image, it is possible to perform positioning easily and compare the measurement data.
机译:测量系统能够准确地对准多个测量目标的相应测量点,以根据测量结果评估测量目标。测量系统包括测量仪器和PC,该测量仪器包括测量测量目标的测量点的光谱单元和实时成像周围环境的照相机。 PC在照相机上显示并显示连续图像信息的评价图像,该评价图像由照相机成像并显示在显示屏幕上,以使其与已经成像并存储在存储器中的静止图像信息的参考图像重叠。通过比较当两个图像彼此重叠时通过评估图像中的测量点获得的数据与参考图像中的点的测量数据,可以容易地进行定位并比较测量数据。

著录项

  • 公开/公告号US2014185927A1

    专利类型

  • 公开/公告日2014-07-03

    原文格式PDF

  • 申请/专利权人 HIDEKI KAWABATA;AKIRA KIJIMA;

    申请/专利号US201214124141

  • 发明设计人 HIDEKI KAWABATA;AKIRA KIJIMA;

    申请日2012-06-07

  • 分类号G06T7/40;

  • 国家 US

  • 入库时间 2022-08-21 16:06:56

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