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Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particle

机译:用于观察单个发光粒子的偏振特性的光学分析装置,光学分析方法和计算机程序

摘要

There is provided an optical analysis technique which observes a polarization characteristic of a light-emitting particle using the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope. In the inventive optical analysis technique, the light detection region is irradiated with excitation light consisting of predetermined polarized light component(s) and the intensity of at least one polarized light component of the light from the light detection region is detected with moving the position of the light detection region of the optical system in a sample solution; a signal of each light-emitting particle is detected individually in the intensity of at least one polarized light component; and based on the intensity of at least one polarized light component of the signal of the detected light-emitting particle, the polarization characteristic value of the light-emitting particle is computed.
机译:提供了一种光学分析技术,该光学分析技术使用扫描分子计数法通过使用共聚焦显微镜或多光子显微镜的光学测量来观察发光粒子的偏振特性。在本发明的光学分析技术中,用由预定的偏振光成分组成的激发光照射光检测区域,并且随着光的位置的移动来检测来自光检测区域的光的至少一种偏振光成分的强度。样品溶液中光学系统的光检测区域;以至少一种偏振光分量的强度分别检测每个发光粒子的信号。根据检测出的发光粒子的信号中至少一种偏振光分量的强度,计算出所述发光粒子的偏振特性值。

著录项

  • 公开/公告号US8803106B2

    专利类型

  • 公开/公告日2014-08-12

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORPORATION;

    申请/专利号US201313864867

  • 发明设计人 TETSUYA TANABE;MITSUSHIRO YAMAGUCHI;

    申请日2013-04-17

  • 分类号G01J1/58;G01N21/64;G02B21/00;

  • 国家 US

  • 入库时间 2022-08-21 16:06:51

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