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Investigation of emission location in top-emitting green organic light-emitting devices by optical analysis

机译:通过光学分析研究顶部发射绿色有机发光器件的发射位置

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A series of top-emitting organic light-emitting devices with different thicknesses of carrier transporting layers (N,N'-di(1-naphtyl)-N,N'-diphenylbenzidine, tris(8-hyroxyquinloine) aluminum (Alq_3)) and emitting layer (EML, 10-(2-Benzothiazolyl)-2,3,6,7-tetrahydro-1,1,7,7-tetramethyl-1H,5H,11H-(1)-benzopyropyrano (6,7-8-i,j)quinolizin-11-one (C545T)-doped Alq_3) were fabricated. C545T-doped Alq_3) was found to bring about double recombination peaks in EML. As the distance between EML and reflective anode was increased, the outcoupling efficiency greatly deviated from optically-simulated values due to charge imbalance in EML and optical loss at the EML/Alq_3 interface. The device with 30 nm of EML exhibited maximized outcoupling efficiency and further increase of EML thickness brought about decrease in efficiency due to decrease in hole-electron recombination at the EML/Alq_3 interface.
机译:一系列具有不同厚度的载流子传输层的顶部发射有机发光器件(N,N'-二(1-萘基)-N,N'-二苯基联苯胺,三(8-羟基喹啉)铝(Alq_3))和发射层(EML,10-(2-Benzothiazolyl)-2,3,6,7-tetrahydro-1,1,7,7-tetramethyl-1H,5H,11H-(1)-benzopyropyrano(6,7-8制备了-i,j)喹啉锌-11-一(C545T)掺杂的Alq_3。发现C545T掺杂的Alq_3在EML中带来了双重重组峰。随着EML与反射阳极之间的距离增加,由于EML中的电荷不平衡和EML / Alq_3界面的光学损耗,耦合效率大大偏离了光学模拟值。具有30 nm EML的器件表现出最大的外耦合效率,并且由于EML / Alq_3界面处空穴电子复合的减少,EML厚度的进一步增加导致效率降低。

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