首页> 外国专利> METHODS OF OPERATING DRAM DEVICES HAVING ADJUSTABLE INTERNAL REFRESH CYCLES THAT VARY IN RESPONSE TO ON-CHIP TEMPERATURE CHANGES

METHODS OF OPERATING DRAM DEVICES HAVING ADJUSTABLE INTERNAL REFRESH CYCLES THAT VARY IN RESPONSE TO ON-CHIP TEMPERATURE CHANGES

机译:具有可响应内部温度变化而变化的内部刷新周期的DRAM设备的操作方法

摘要

An integrated circuit memory device includes a refresh control circuit that generates an internal memory refresh command signal having a period that is changed relative to a period of an external memory refresh command signal received by the memory device. This change in the period of the internal memory refresh command may be in response to detecting a change in temperature of the memory device. In particular, the refresh control circuit is configured so that the period of the internal memory refresh command signal is increased in response to detecting a reduction in temperature of the memory device.
机译:集成电路存储器装置包括刷新控制电路,该刷新控制电路生成内部存储器刷新命令信号,该内部存储器刷新命令信号的周期相对于该存储器设备接收的外部存储器刷新命令信号的周期而改变。内部存储器刷新命令的周期的这种改变可以响应于检测到存储装置的温度改变。特别地,刷新控制电路被配置为使得响应于检测到存储装置的温度降低而增加内部存储器刷新命令信号的周期。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号