首页> 外国专利> SEMICONDUCTOR MEMORY INTEGRATED DEVICE HAVING A PRECHARGE CIRCUIT WITH THIN-FILM TRANSISTORS GATED BY A VOLTAGE HIGHER THAN A POWER SUPPLY VOLTAGE

SEMICONDUCTOR MEMORY INTEGRATED DEVICE HAVING A PRECHARGE CIRCUIT WITH THIN-FILM TRANSISTORS GATED BY A VOLTAGE HIGHER THAN A POWER SUPPLY VOLTAGE

机译:半导体存储器集成设备具有带薄膜晶体管的预充电电路,薄膜晶体管的电压高于电源电压

摘要

Provided is a semiconductor integrated device including a semiconductor memory circuit and a peripheral circuit of the semiconductor memory circuit. The peripheral circuit includes a first transistor having a first voltage as a breakdown voltage of a gate oxide film. The semiconductor memory circuit includes a pair of bit lines, one of the pair of bit lines being connected to a gate transistor of a memory cell, and a precharge circuit that includes a transistor having a breakdown voltage substantially equal to that of the first transistor, and precharges the pair of bit lines to a predetermined voltage in response to an activation signal. The activation signal of the precharge circuit is a second voltage higher than the first voltage.
机译:提供一种半导体集成器件,包括半导体存储电路和半导体存储电路的外围电路。外围电路包括具有第一电压作为栅极氧化膜的击穿电压的第一晶体管。半导体存储电路包括一对位线,该对位线中的一个连接到存储单元的栅极晶体管,以及预充电电路,其包括击穿电压与第一晶体管的击穿电压基本相等的晶体管。并响应于激活信号将一对位线预充电到预定电压。预充电电路的激活信号是高于第一电压的第二电压。

著录项

  • 公开/公告号US2014119145A1

    专利类型

  • 公开/公告日2014-05-01

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORPORATION;

    申请/专利号US201414147166

  • 发明设计人 HIROYUKI TAKAHASHI;TETSUO FUKUSHI;

    申请日2014-01-03

  • 分类号G11C7/12;G11C7/06;

  • 国家 US

  • 入库时间 2022-08-21 16:05:43

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