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Laminated thin film metal-semiconductor multilayers for thermoelectrics

机译:用于热电的层压薄膜金属-半导体多层

摘要

A thermoelectric segment and a method for fabricating. The fabricating includes forming structures by depositing thin-film metal-semiconductor multilayers on substrates and depositing metal layers on the multilayers, joining metal bonding layers to form dual structures with combined bonding layers; and removing at least one of the substrates; and using the dual structure to form a thermoelectric segments. The method can include dicing the dual structures before or after removing the substrates. The method can include depositing additional bonding layers and joining dual structures to make thermoelectric segments of different thicknesses. Each multilayer can be about 5-10 μm thick. Each bonding layer can be about 1-2 μm thick. The bonding layers can be made of a material having high thermal and electrical conductivity. The multilayers can be (Hf,Zr,Ti,W)N/(Sc,Y,La,Ga,In,Al)N superlattice layers. Metal nitride layers can be deposited between each of the bonding layers and multilayers.
机译:一种热电部分及其制造方法。所述制造包括通过在基板上沉积薄膜金属-半导体多层并在所述多层上沉积金属层,结合金属结合层以形成具有结合结合层的双重结构来形成结构;并去除至少一个基板;并使用双重结构形成热电段。该方法可以包括在去除基板之前或之后对双重结构进行切割。该方法可以包括沉积额外的粘结层和接合双重结构以制造不同厚度的热电段。每个多层可以为约5-10μm厚。每个结合层可以为约1-2μm厚。结合层可以由具有高导热性和导电性的材料制成。多层可以是(Hf,Zr,Ti,W)N /(Sc,Y,La,Ga,In,Al)N超晶格层。可以在每个粘结层和多层之间沉积金属氮化物层。

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