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Device and method for calibrating an X-ray detector, calibration apparatus and X-ray apparatus

机译:用于校准x射线探测器的装置和方法,校准设备和x射线设备

摘要

A device and a method are disclosed, for energetic calibration of a photon-counting X-ray radiation detector by way of X-ray fluorescence radiation. The device includes a plurality of specifically selected elements, of which each element, upon being irradiated with electrons or with high-energy radiation, emits photons of X-ray fluorescence radiation of at least one specific or characteristic energy. The photons of X-ray fluorescence radiation of the at least one specific or characteristic energy are then useable or are used for energetic calibration of the photon-counting X-ray radiation detector. A calibration apparatus and an X-ray apparatus are also disclosed, which include such a device.
机译:公开了一种用于通过X射线荧光辐射对光子计数X射线辐射检测器进行能量校准的装置和方法。该装置包括多个专门选择的元件,其中每个元件在被电子或高能辐射线照射后发射至少一种比能或特征能的X射线荧光辐射的光子。然后,至少一种比能或特征能的X射线荧光辐射的光子可以被使用或用于计数光子的X射线辐射探测器的能量校准。还公开了包括这种设备的校准设备和X射线设备。

著录项

  • 公开/公告号US8696201B2

    专利类型

  • 公开/公告日2014-04-15

    原文格式PDF

  • 申请/专利权人 EDGAR KRAFT;BJÖRN KREISLER;

    申请/专利号US201113293179

  • 发明设计人 BJÖRN KREISLER;EDGAR KRAFT;

    申请日2011-11-10

  • 分类号G01D18/00;

  • 国家 US

  • 入库时间 2022-08-21 16:03:16

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