Method and system for detecting and repairing defective memory cells without reporting a defective memory cell

摘要

A system includes a first device, a first storage element, a comparator and a second device. The first device is configured to test memory cells in an array of memory cells to detect defective memory cells. The defective memory cells include a first memory cell and a second memory cell. The first storage element is configured to store a first address of the first memory cell. The comparator is configured to compare a second address of the second memory cell to the first address. The second device is configured to (i) in response to the second address matching the first address, direct the first device to continue the testing of the memory cells in the array of memory cells without reporting the second memory cell as defective, (ii) during the testing of the memory cells, record a number of times the first address is matched with one or more addresses of the memory cells in the array of memory cells, and (iii) based on the number of times the first address is matched, repair a row of the array of memory cells or a column of the array of memory cells.