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Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns
Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns
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机译:使用异步定时变化的电源电压和测试模式对集成电路进行裕度测试的方法和装置
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摘要
Method and apparatus for margin testing integrated circuits. The method includes selecting a clock frequency, an operating temperature range and a power supply voltage level for margin testing an integrated circuit wherein one or more of the clock frequency, the operating temperature range and the power supply voltage level is outside of the normal operating conditions of the integrated circuit; applying an asynchronously time varying power supply voltage set to the selected power supply voltage level to the integrated circuit; running the integrated circuit chip at the selected clock frequency and maintaining the integrated circuit within the selected temperature range; applying a continuous test pattern to the integrated circuit; and monitoring the integrated circuit for fails.
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