首页> 外国专利> Method for analyzing placement context sensitivity of standard cells

Method for analyzing placement context sensitivity of standard cells

机译:分析标准单元格放置上下文敏感性的方法

摘要

A disclosed method for evaluating placement context sensitivity in the design of an integrated circuit includes accessing a standard cell library comprising a database of standard cells and determining generating boundary data for each of the standard cells. The boundary data for a standard cell indicates the layout of features located within boundary regions of the standard cell. The method includes merging or consolidating boundary data for any two standard cells if their boundary data is the same to determine a canonical or minimal set of boundary regions. The disclosed method further includes enumerating and evaluating all combinations of pairs of the canonical boundary regions and, responsive to identifying of a proximity-based sensitivity or exception, modifying, notating, or otherwise remediating the applicable one or more standard cells that correspond to the boundary region combination that raised the exception.
机译:用于评估集成电路设计中的放置上下文敏感性的公开方法包括访问包括标准单元数据库的标准单元库,并确定为每个标准单元生成边界数据。标准单元的边界数据指示位于标准单元边界区域内的要素的布局。该方法包括如果任意两个标准单元的边界数据相同,则合并或合并边界数据,以确定边界区域的规范或最小集合。所公开的方法进一步包括枚举和评估规范边界区域对的所有组合,并且响应于基于接近度的灵敏度或异常的识别,修改,标注或以其他方式补救对应于该边界的一个或多个标准单元。引发异常的区域组合。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号