首页> 外国专利> PROCEDURE OF CALIBRATION OF MEASURING DEVICE FOR MEASURING AMPLITUDE AND PHASE DEPENDENCE OF LARGER AMOUNT OF HIGH FREQUENCY SIGNALS

PROCEDURE OF CALIBRATION OF MEASURING DEVICE FOR MEASURING AMPLITUDE AND PHASE DEPENDENCE OF LARGER AMOUNT OF HIGH FREQUENCY SIGNALS

机译:高频信号量大和相位相关的测量装置的校准过程

摘要

the invention relates to a measuring device for measuring the precision of calibration amplitude and phase dependence of a number of high frequency signals.the solution is in the combination of beam position measurement precision without interruption, a measuring device with a radio frequency (rf) umerjevalnim procedure komutacije processing units with the calibration frequency rf processing units (41, 42,4n) with a reference signal (r l, r2. rn), which allows the calibration without the input signal (si, s2. sn).the device according to the invention is therefore 10 universal and precise measuring position on the cyclic pospeu0161evalnikih beam, such as, for example, sinhrotroni and acyclic linear pospeu0161evalnikih elementary particles. the proposed method allows a precise knowledge of the absolute value ojau010denj (g1, g2... gn) rf processing units (41, 42,.4n) and, therefore, the invention is further useful for the precise measurement of beam time for strength.
机译:本发明涉及一种用于测量多个高频信号的校准幅度和相位相关性的精度的测量装置。解决方案是结合不间断的波束位置测量精度,一种具有射频(rf)umerjevalnim的测量装置校准频率rf处理单元(41、42,4n)带有参考信号(r1,r2。rn)的过程komutacije处理单元,它可以在没有输入信号(si,s2。sn)的情况下进行校准。因此,本发明是在循环正弦波和非环状线性正弦波基本粒子上的10个通用且精确的测量位置。所提出的方法允许精确地知道绝对值oja u010denj(g1,g2 ... gn)rf处理单元(41,42,.4n),因此,本发明对于精确测量束时间是有用的。为了力量。

著录项

  • 公开/公告号SI24332A

    专利类型

  • 公开/公告日2014-09-30

    原文格式PDF

  • 申请/专利权人 DROMEDAR D.O.O.;

    申请/专利号SI20130000056

  • 发明设计人 BORUT SCARON;OLAR;

    申请日2013-03-14

  • 分类号G01R19/00;

  • 国家 SI

  • 入库时间 2022-08-21 15:56:20

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