SAMPLES HOLDERS – GRIDS – SUPPORTS FOR THE SAMPLES CHARACTERIZATION OR PROCESSING WITH ELECTRON, ION, MOLECULAR, ATOMIC, PHOTON OR OTHER BEAMS

• 1. 一种用于原子力显微镜表征的锂离子电池电极片的截面样品及其制备方法 [P] . 中国专利： CN111693736A . 2020-09-22
• 2. 一种透射电子显微镜双倾样品台和铍样品台通用样品固定夹 [P] . 中国专利： CN206564234U . 2017.10.17
• 3. SAMPLE PREPARATION METHOD FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE SUPPORT STRUCTURE FOR THE TRANSMISSION ELECTRON MICROSCOPE, SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS [P] . 日本专利： JP2009115582A . 2009-05-28

  机译： 透射电子显微镜的样品制备方法，透射电子显微镜的样品支撑结构，样品架和带电粒子束装置

• 4. sample processing observation system which the sample holder, using the same sample observation method, ion beam apparatus and a transmission electron microscope [P] . 日本专利： JP2842083B2 . 1998-12-24

  机译： 样品处理观察系统，其中的样品架采用相同的样品观察方法，离子束装置和透射电子显微镜

• 5. SOLID STATE MEMBRANE CHANNEL DEVICE FOR THE MEASUREMENT AND CHARACTERIZATION OF ATOMIC AND MOLECULAR SIZED SAMPLES [P] . 美国专利： US2009277869A1 . 2009-11-12

  机译： 用于测量和表征原子和分子尺寸样品的固态膜通道装置

• 1. Oxidative desulfurization of model and real oil samples using Mo supported on hierarchical alumina–silica:Process optimization by Box–Behnken experimental design [J] . Nasim Ghorbani, Gholamreza Moradi 中国化学工程学报（英文版） . 2019,第011期
• 2. Preparation and Characterization of Electron-Beam Evaporated Cu-lnSe Thin Films Using Two Stage Processes [J] . Md. Ariful Islam, Md. Nuruzzaman, Ratan Chandra Roy, 物理科学与应用：英文版 . 2016,第003期
• 3. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images. [J] . Lin AC, Goh MC Journal of Microscopy . 2002,第Pta2期
• 4. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images [J] . Lin AC., Goh MC. Journal of Microscopy . 2002,第Pta2期
• 5. Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips [J] . Eisenstein Alon, Goh M. Cynthia Review of Scientific Instruments . 2012,第3期
• 6. Parallel Transmission Electron and Atomic Force Microscopy: Direct andRepetitive Correlation of TEM and AFM images by a Novel Sample Holder [C] . Alvin C. Lin, M. Cynthia Goh Microscopy Society of America annual meeting . 2002
• 7. Growth and characterization of diamond-like carbon and diamond films: Effect of atomic hydrogen beams and studies of field emission of electrons. [D] . Stavrides, Alexander P. 2000
• 8. Using gridded population and quadtree sampling units to support survey sample design in low-income settings [O] . Sarchil Hama Qader, Veronique Lefebvre, Andrew J. Tatem, 2020
• 9. On the pressing need to address beam–sample interactions in atomic resolution electron microscopy [O] . Christian Kisielowski 2015
• 10. Defect Characterization of Molecular Beam Modular Epitaxially Grown HgCdTe Samples. [R] . Olver, I. 2009

• 1. Effect of sample treatment on determination of arsenic （Ⅲ） and arsenic （Ⅴ） in aqueous and tissue samples by hydride generation atomic absorption spectrometry [J] . Jamileh Salar-Amoli ,Tahereh Ali-Esfahani ,Jalal Hassan . 化学与化工 . 2009,第006期
• 2. A Simple Sample Processing Protocol and Multiplex PCR for Direct Detection of MRSA from Uncultured Clinical Samples—A Pilot Study [J] . Rosy Chikkala ,Swathi Ch ,Sireesha Divyakolu . 传染病进展（英文） . 2019,第1期
• 3. Optimizing Sampling, Sample Processing and Analysis Methods for Radon (SUP222/SUPRn) in Water by Liquid Scintillation Counting [J] . Uttam K. Saha ,Michael E. Kitto ,Dana R. Lynch . 美国分析化学（英文） . 2018,第1期
• 4. 微波消解-电感耦合等离子体质谱法和电感耦合等离子体原子发射光谱法测定植物样品中20种主次量元素 [C] . 程秀花 ,黎卫亮 ,王鹏 . 全国理化测试学术研讨会暨《理化检验》创刊50周年大会 . 2012
• 5. ICP-MS测定地球化学样品中多原子分子离子干扰消除技术的研究及方法应用 [A] . 高小红 . 2016